A cost-effective, reliable, and highly configurable product family designed to address diverse customer requirements

FOX-1 Full Wafer, single touchdown sort tester and burn-in system

• •Flexible Solution for High Throughput Test Floor

• -Same system tests memory or logic

• -Reduces floor space requirements

• •Cost-effective Solution for Single Touchdown Full Wafer Test

• -Dramatically reduces test time

• -Up to 12,000 power channels

• -Up to 3500 I/O channels ( nearly 200,000 device I/O lines using parallel test technology )

• -Electronics optimized for BIST/DFT testing

• •Production Proven Full-Wafer Tester Solution

• -Dozens of systems in production

• -Protects wafers and probe cards with individual power channel over-current protection

• -Standard cassette/FOUP automation

Brochure SignFox1.pdf