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Fast Automated C-SAM® Tray Scanning System
The FACTS2™ delivers state-of-the-art, automated AMI inspection for quality and process control. Delivering high throughput with minimal operator interaction, FACTS2 helps ensure defect-free production with potentially no reduction in throughput.
FACTS2 automatically inspects up to 10,000 integrated circuits per hour. Up to 35 JEDEC trays of singulated ICs can be stacked as a batch, or trays can be inspected as part of an in-line process. In addition, the FACTS2 can also handle multi-layer ceramic chip capacitors, flip chips and other components.
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