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Nordson Dage Bond Tester | ||||
| Bond Tester | |||||
| High Speed Bond Tester | |||||
| 4000 | Multi-purpose Bond Tester | ||||
| 4000W |
Wafer Handling System | ||||
| 4300 |
Bond Tester | ||||
| 4300FP | Semi-automatic Wafer Bump Testing | ||||
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Nordson Dage X-Ray Inspection System | ||||
| XD7500VR | Bond Tester | ||||
| XD7500VR |
Jade FP | ||||
| XD7600NT | Ruby | ||||
| XD7600NT | Ruby FP | ||||
| XD7600NT | Diamond | ||||
| XD7600NT | Diamond FP | ||||
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Sonoscan Sound Technology with Vision | ||||
| FACTS32™ | C-SAM© | ||||
| Gen5™ | C-SAM© | ||||
| Fastline™ | P300™C-SAM® | ||||
| D9500™ | C-SAM© | ||||
| AW300™ | Series C-SAM© | ||||
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Chroma CIS and System Level Test Solution | ||||
| 3140 | Pick & Place IC Handler | ||||
| 3260 | ASFT Automatic System Function Tester | ||||
| 3270 | CIS Solution Handler | ||||
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AEHR Test Systems | |||
| ABTS | Advance Burn-in and Test System |
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| ABTS-L | For Test and Burn-in of Logic Devices | |||
| ABTS-M | For Test and Burn-in of Memory Devices | |||
| FOX-15 | Family of Full Wafer Burn-in & Test Systems | |||
| ABTS-Mini | For Lab use (Logic or Memory) | |||
| ABTS-EWS | Engineering Work Station | |||
| FOX-1 | Full Wafer, single touchdown sort tester and Burn-in system | |||
| KGD | Know Good Die Solutions | |||
| FOX | Full Wafer Contractors | |||
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