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The Nano-DST™ is a state of the art high performance atomic force microscope. It features a stage with two independent scanners: one for metrology and the other for rapid scanning. The electronic controller operates in a Linux environment and includes the highest stability, low noise phase and amplitude detection electronics, 24 bit scan control, and configurable PID control.

 

Advanced features of the Nano-DST™ are:

Dual Scanner Control (DST): Two scanners can be driven individually or simultaneously in the Nano-DST™, to perform rapid scanning, panning, and achieve the highest resolution possible.

Modular Electronic Controller: Because the Nano- DST™ electronic controller is modular, it can be configured for an endless number of experiments and applications.

Flexure Scanner with 3-D Calibration Sensors: With the proprietary flexure scanner design, the most accurate and precise data is measurable with the Nano- DST™. Optional scan ranges as high as 350 microns are possible.

Advanced Specifications: 24 bit scan control as well as a 400 MHz, low noise, high stability modulation electronics assures the highest performance specifications available in an SPM system.

Designed for modes: With the Nano-DST™ all AFM modes may be implemented including SThM, MFM, EFM, STM, SKPM... Support is provided by Pacific Nanotechnology for customers that want to experiment with new modes.

Motorized Stage Control: The Nano-DST™ stage includes seven stepper motors that control the sample position, optics zoom, and focus. Z axis motion control, with 3 motors, facilitates rapid probe approach as well as enables control of the probe/sample angle. All motors are operated by our new high speed motor controller.

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