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The Nano-R2™ system is the second generation of the Nano-R™ laboratory scanning probe microscope (SPM) offered by Pacific Nanotechnology. It is a powerful, multi-purpose SPM for capturing images and measurements of structures with nanometer sized features. Because the Nano-R2™ SFM can be used with two versions of image acquisition software, X'pert? and EZMode™, it is optimized for both novice and expert users. The Nano-R2™ includes everything required for AFM imaging: a master computer, a control unit, and the Nano-R2™ stage. Also, software for displaying and analyzing images is provided with the Nano-R2™ SPM. See Figure 1
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Figure 1.
Advanced features included with the Nano-R2™ are:
¡E Compatible with light lever and crystal sensors
¡E Dual 19¡¨ LCD monitors
¡E Advanced 16/32 bit controller architecture
¡E Enhanced Software functions
¡E Scanner Auto-Level
¡E Stage Tilt Function
¡E Optical Assisted Probe Approach
¡E Enhanced F/D Software
¡E T+E Image Enhancement
¡E Advanced probe approach
¡E Line scan FFT function
¡E Optional Particle Analysis substrates
¡E Real time XY stage control
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